Description

A Scanning Electron Microscope (SEM) is an advanced imaging tool that uses a focused beam of electrons to produce highly detailed images of a sample’s surface. Unlike optical microscopes, SEMs offer higher magnification and resolution, providing a three-dimensional view with a large depth of field. They are versatile, capable of examining various materials like metals, biological specimens, and composites. SEMs can also perform elemental analysis using detectors such as Energy Dispersive X-ray Spectroscopy (EDS).

Usage Guidelines

Soon…

Availability and usage

Soon…

Collaboration

Soon…